{
  "containers": {
    "adp": [
      {
        "metrics": [
          {
            "other": {
              "content": {
                "id": "CVE-2025-9709",
                "options": [
                  {
                    "Exploitation": "poc"
                  },
                  {
                    "Automatable": "no"
                  },
                  {
                    "Technical Impact": "total"
                  }
                ],
                "role": "CISA Coordinator",
                "timestamp": "2025-09-05T18:07:39.209816Z",
                "version": "2.0.3"
              },
              "type": "ssvc"
            }
          }
        ],
        "providerMetadata": {
          "dateUpdated": "2025-09-05T18:07:49.930Z",
          "orgId": "134c704f-9b21-4f2e-91b3-4a467353bcc0",
          "shortName": "CISA-ADP"
        },
        "title": "CISA ADP Vulnrichment"
      }
    ],
    "cna": {
      "affected": [
        {
          "collectionURL": "https://www.nordicsemi.com/Products/nRF52810",
          "defaultStatus": "unaffected",
          "product": "nRF52810",
          "vendor": "Nordic Semiconductor",
          "versions": [
            {
              "status": "affected",
              "version": "0"
            }
          ]
        }
      ],
      "credits": [
        {
          "lang": "en",
          "type": "finder",
          "value": "Milena Mangiola"
        }
      ],
      "descriptions": [
        {
          "lang": "en",
          "supportingMedia": [
            {
              "base64": false,
              "type": "text/html",
              "value": "On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible."
            }
          ],
          "value": "On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible."
        }
      ],
      "impacts": [
        {
          "capecId": "CAPEC-624",
          "descriptions": [
            {
              "lang": "en",
              "value": "CAPEC-624: Hardware Fault Injection"
            }
          ]
        }
      ],
      "metrics": [
        {
          "cvssV4_0": {
            "Automatable": "NOT_DEFINED",
            "Recovery": "NOT_DEFINED",
            "Safety": "PRESENT",
            "attackComplexity": "LOW",
            "attackRequirements": "NONE",
            "attackVector": "PHYSICAL",
            "baseScore": 8.6,
            "baseSeverity": "HIGH",
            "privilegesRequired": "NONE",
            "providerUrgency": "NOT_DEFINED",
            "subAvailabilityImpact": "HIGH",
            "subConfidentialityImpact": "HIGH",
            "subIntegrityImpact": "HIGH",
            "userInteraction": "NONE",
            "valueDensity": "NOT_DEFINED",
            "vectorString": "CVSS:4.0/AV:P/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:H/SI:H/SA:H/S:P",
            "version": "4.0",
            "vulnAvailabilityImpact": "HIGH",
            "vulnConfidentialityImpact": "HIGH",
            "vulnIntegrityImpact": "HIGH",
            "vulnerabilityResponseEffort": "NOT_DEFINED"
          },
          "format": "CVSS",
          "scenarios": [
            {
              "lang": "en",
              "value": "GENERAL"
            }
          ]
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      ],
      "problemTypes": [
        {
          "descriptions": [
            {
              "cweId": "CWE-1191",
              "description": "CWE-1191: On-Chip Debug and Test Interface With Improper Access Control",
              "lang": "en",
              "type": "CWE"
            }
          ]
        },
        {
          "descriptions": [
            {
              "cweId": "CWE-1319",
              "description": "CWE-1319: Improper Protection against Electromagnetic Fault Injection (EM-FI)",
              "lang": "en",
              "type": "CWE"
            }
          ]
        },
        {
          "descriptions": [
            {
              "description": "Runtime Hardware Protection Bypass",
              "lang": "en"
            }
          ]
        }
      ],
      "providerMetadata": {
        "dateUpdated": "2025-09-05T17:16:16.345Z",
        "orgId": "1c6b5737-9389-4011-8117-89fa251edfb2",
        "shortName": "Toreon"
      },
      "references": [
        {
          "url": "https://raelize.com/upload/research/2022/No_Hat_2022_-_Glitching_devices_for_code_execution_v1.1.pdf"
        },
        {
          "url": "https://raelize.com/upload/research/2025/Dartmouth_202505_False-Injections-Tales-of-Physics-Misconceptions-and-Weird-Machines_v1.1.pdf"
        },
        {
          "url": "https://nvd.nist.gov/vuln/detail/CVE-2020-27211"
        },
        {
          "url": "https://www.toreon.com/cve-2025-9709-major-vulnerability-in-common-chip/"
        }
      ],
      "source": {
        "discovery": "UNKNOWN"
      },
      "title": "NRF52810 Runtime EM Fault Injection APPROTECT Bypass",
      "x_generator": {
        "engine": "Vulnogram 0.2.0"
      }
    }
  },
  "cveMetadata": {
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    "assignerShortName": "Toreon",
    "cveId": "CVE-2025-9709",
    "datePublished": "2025-09-05T17:16:16.345Z",
    "dateReserved": "2025-08-29T16:27:34.512Z",
    "dateUpdated": "2025-09-05T18:07:49.930Z",
    "state": "PUBLISHED"
  },
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  "dataVersion": "5.1"
}